TestDeveloper

The number one choice for fabless customers, TestDeveloper rapidly reduces test development time and improves reliability with an easy-to-use graphical environment. Find out how to discover potential compatibility problems early in the process.

TD-Scan
Low-cost, scalable pattern conversion software designed to translate scan patterns (ATPG) in WGL or STIL format to a target ATE program format.

TD-Sim
Low-cost, scalable pattern conversion software designed to translate both scan patterns mentioned above and functional patterns from logic simulators in the format of VCD or EVCD event files.